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DualEELS at High Energy Losses: Exploring Lower Accelerating Voltages and Absolute Cross Sections

Published online by Cambridge University Press:  01 August 2018

Ian MacLaren
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow, Scotland, UK.
Hidetaka Sawada
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grunberg Institute Forschungszentrum Julich, Germany.
Samuel McFadzean
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow, Scotland, UK.
Luke Gardiner
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow, Scotland, UK.
Katherine E. MacArthur
Affiliation:
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons and Peter Grunberg Institute Forschungszentrum Julich, Germany.
Alan J. Craven
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow, Scotland, UK.

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Craven, AJ, et al, Ultramicroscopy 180 2017) p. 66.Google Scholar
[2] Annand, KJ, MacLaren, I Gass, M J. Nucl. Mater. 465 2015) p. 390.Google Scholar
[3] MacLaren, I, et al Microscopy (2017) doi: 10.1093/jmicro/dfx036.Google Scholar
[4] Bashir, A, et al, J. Appl. Phys. 123 2018) p. 035703.Google Scholar
[5] Ahn, CC Krivanek, OL in "EELS Atlas" (Arizona State University).Google Scholar
[6] KM acknowledges the funding from Helmholtz Association through a postdoctoral fellowship.Google Scholar