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Direct Detection EELS at High Energy: Elemental Mapping and EXELFS

Published online by Cambridge University Press:  05 August 2019

James L. Hart ,
Andrew C. Lang ,
Rebecca B. Cummings ,
Ian MacLaren  and
Mitra L. Taheri
James L. Hart
Affiliation:
Department of Materials Science & Engineering, Drexel University, Philadelphia, PA 19104, USA
Andrew C. Lang
Affiliation:
Department of Materials Science & Engineering, Drexel University, Philadelphia, PA 19104, USA
Rebecca B. Cummings
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK
Ian MacLaren
Affiliation:
School of Physics and Astronomy, University of Glasgow, Glasgow G12 8QQ, UK
Mitra L. Taheri*
Affiliation:
Department of Materials Science & Engineering, Drexel University, Philadelphia, PA 19104, USA
*
*Corresponding author: mtaheri@coe.drexel.edu

Abstract

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Type
Current Trends and Challenges in Electron Energy-Loss Spectroscopy
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 584 - 585
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Craven, A. J., Sawada, H., McFadzean, S. and MacLaren, I., Ultramicroscopy 180 (2017), p. 66.Google Scholar
[2]Maclaren, I., Annand, K. J., Black, C., Craven, A. J.., Microscopy 67 [S1] (2018), p. i78Google Scholar
[3]Hart, J.L. et al. , Scientific Reports 7 (2017), article number 8243Google Scholar
[4]Ravel, B. and Newville, M., Journal of Synchrotron Radiation 12 (2005), p. 537-541Google Scholar
[5]JLH, ACL, and MLT acknowledge funding from NSF MRI grant number 1429661. RBC acknowledges funding from the EPSRC for her studentship.Google Scholar