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Microscopy and Microanalysis Microscopy and Microanalysis

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Diffraction Contrast Scanning Transmission Electron Microscopy - A Bend-contour-free Way to Image Dislocations, Voids and Precipitates

Published online by Cambridge University Press:  01 August 2018

Yuanyuan Zhu ,
Colin Ophus ,
Mychailo B. Toloczko  and
Danny J. Edwards
Yuanyuan Zhu
Affiliation:
Energy and Environmental Directorate, Nuclear Sciences Division, Pacific Northwest National Laboratory, Richland, WA99352, USA
Colin Ophus
Affiliation:
National Center for Electron Microscopy, Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California94720, USA
Mychailo B. Toloczko
Affiliation:
Energy and Environmental Directorate, Nuclear Sciences Division, Pacific Northwest National Laboratory, Richland, WA99352, USA
Danny J. Edwards
Affiliation:
Energy and Environmental Directorate, Nuclear Sciences Division, Pacific Northwest National Laboratory, Richland, WA99352, USA

Abstract

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Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1472 - 1473
Copyright
© Microscopy Society of America 2018 

References

[1] Phillips, PJ, Brandes, MC, Mills, MJ Graef, M De Ultramicroscopy 111 2011 1483–1487.CrossRefGoogle Scholar
[2] Zhu, Y, Ophus, C, Toloczko, MB Edwards, DJ submitted.Google Scholar
[3] The authors acknowledge funding from the U.S. Department of Energy Office of Nuclear Energy’s Nuclear Energy Enabling Technologies program project CFA 16-10570, Office of Fusion Energy Sciences under contract DE-AC05-76RL01830, and for Molecular Foundry which is supported by the Office of Basic Energy Sciences, under Contract No. DE-AC02-05CH11231.Google Scholar
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Diffraction Contrast Scanning Transmission Electron Microscopy - A Bend-contour-free Way to Image Dislocations, Voids and Precipitates
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