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Development of Fast Pixelated STEM Detector and its Applications using 4-Dimensional Dataset

Published online by Cambridge University Press:  04 August 2017

Ryusuke Sagawa
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan.
Hao Yang
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, California, USA.
Lewys Jones
Affiliation:
Department of Materials, University of Oxford, Oxford, UK.
Martin Simson
Affiliation:
PNDetector, PNDetector GmbH, Munchen, Germany
Martin Huth
Affiliation:
PNDetector, PNDetector GmbH, Munchen, Germany
Heike Soltau
Affiliation:
PNDetector, PNDetector GmbH, Munchen, Germany
Peter D. Nellist
Affiliation:
Department of Materials, University of Oxford, Oxford, UK.
Yukihito Kondo
Affiliation:
EM Business Unit, JEOL Ltd., Tokyo, Japan.
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© Microscopy Society of America 2017 

References

[1] Okunishi, E, et al, Microsc. Microanal. 15 2009). p. 164.CrossRefGoogle Scholar
[2] Shibata, N, et al, J. Electron Microsc. 59 2010). p. 473.CrossRefGoogle Scholar
[3] Ryll, H, et al, J. Instrum. 11 2016 P04006.CrossRefGoogle Scholar
[4] Lupini, AR, Chi, M & Jesse, S J. Microsc. 263 2016). p. 43.CrossRefGoogle Scholar
[5] Tate, MW, et al, Microsc. Microanal. 22 2016). p. 237.CrossRefGoogle Scholar
[6] Krajnak, M, et al, Ultramicroscopy 165 2016). p. 42.CrossRefGoogle Scholar
[7] Nellist, PD, McCallum, B.C. & Rodenburg, J.M. Nature 374 1995). p. 630.CrossRefGoogle Scholar
[8] Pennycook, TJ, et al, Ultramicroscopy 151 2015). p. 160.CrossRefGoogle Scholar
[9] Yang, H, et al., Nature Communications 7 2016). p. 12532.CrossRefGoogle Scholar
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