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Development of a Monochromated and Aberration-Corrected Low-Voltage (S)TEM

Published online by Cambridge University Press:  23 September 2015

Masaki Mukai
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
Shigeyuki Morishita
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
Atsushi Kimura
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
Akihiro Ikeda
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
Kazunori Somehara
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
Hidetaka Sawada
Affiliation:
JEOL Ltd., 3-1-2 Musashino, Akishima, Tokyo 196-8558, Japan
Luiz H. G. Tizei
Affiliation:
.Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST),Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan
Yung-Chang Lin
Affiliation:
.Nanotube Research Center, National Institute of Advanced Industrial Science and Technology (AIST),Central 5, 1-1-1 Higashi, Tsukuba, Ibaraki 305-8565, Japan
Koji Kimoto
Affiliation:
.National Institute for Materials Science (NIMS), 1-1, Namiki, Tsukuba, Ibaraki, 305-0044, Japan
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Abstract

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Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Sawada, H., et al.., J. Electron. Microsc. 58 (2009) 341.CrossRefGoogle Scholar
[2] Suenaga, K. & Koshino, M., Nature 468 (2010) 1088.CrossRefGoogle Scholar
[3] Mukai, M., et al.., Ultramicroscopy 140 (2014) 37.CrossRefGoogle Scholar
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