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Denoising Atomic Resolution Hyperspectral Data with Tensor Singular Value Decomposition

Published online by Cambridge University Press:  30 July 2020

Chenyu Zhang
Affiliation:
University of Wisconsin-Madison, Madison, Wisconsin, United States
Rungang Han
Affiliation:
University of Wisconsin-Madison, Madison, Wisconsin, United States
Anru Zhang
Affiliation:
University of Wisconsin-Madison, Madison, Wisconsin, United States
Paul Voyles
Affiliation:
University of Wisconsin-Madison, Madison, Wisconsin, United States

Abstract

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Type
Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Copyright
Copyright © Microscopy Society of America 2020

References

Ophus, C. Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond. Microsc. Microanal. 25, 563582 (2019).10.1017/S1431927619000497CrossRefGoogle ScholarPubMed
Zhang, A. & Xia, D. Tensor SVD: Statistical and Computational Limits. IEEE Trans. Inf. Theory 64, 73117338 (2018).10.1109/TIT.2018.2841377CrossRefGoogle Scholar
Yankovich, A. B. et al. . Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images. Nanotechnology 27, 364001 (2016).10.1088/0957-4484/27/36/364001CrossRefGoogle ScholarPubMed
Maggioni, M., Katkovnik, V., Egiazarian, K. & Foi, A. Nonlocal transform-domain filter for volumetric data denoising and reconstruction. IEEE Trans. Image Process. 22, 119133 (2013).10.1109/TIP.2012.2210725CrossRefGoogle ScholarPubMed
This work was supported by the US. Department of Energy, Basic Energy Sciences (DE-FG02-08ER46547).Google Scholar