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Defect-assisted Reorganization of Ferroelectric Domain Walls Revealed by Aberration-corrected Electron Microscopy

Published online by Cambridge University Press:  01 August 2018

Lin-Ze Li ,
Jacob Jokisaari ,
Yi Zhang ,
Xiao-Xing Cheng ,
Long-Qing Chen ,
Colin Heikes ,
Darrell Schlom  and
Xiao-Qing Pan
Lin-Ze Li
Affiliation:
Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, CA.
Jacob Jokisaari
Affiliation:
Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, CA.
Yi Zhang
Affiliation:
Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, CA.
Xiao-Xing Cheng
Affiliation:
Department of Materials Science and Engineering, Penn State University, University Park, PA.
Long-Qing Chen
Affiliation:
Department of Materials Science and Engineering, Penn State University, University Park, PA.
Colin Heikes
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY.
Darrell Schlom
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY.
Xiao-Qing Pan
Affiliation:
Department of Chemical Engineering and Materials Science, University of California - Irvine, Irvine, CA. Department of Physics and Astronomy, University of California - Irvine, Irvine, CA.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 104 - 105
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Li, L.Z., et al, Phys. Rev. Lett. 2018.Google Scholar
[2] The author gratefully acknowledges the financial support by the Department of Energy (DOE) under grant DESC0014430..Google Scholar