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DeepSerialBlockFace: Machine denoising and object segmentation for volume electron microscopy

Published online by Cambridge University Press:  30 July 2021

Chandran Sabanayagam ,
Wayne Treible ,
Jean Ross  and
Jeffrey Caplan
Chandran Sabanayagam
Affiliation:
University of Delaware, Delaware Biotechnology Institute, Newark, Delaware, United States
Wayne Treible
Affiliation:
Univeristy of Delaware, Department of Computer Information Sciences, Delaware, United States
Jean Ross
Affiliation:
University of Delaware, Delaware Biotechnology Insitute, Newark, Delaware, United States
Jeffrey Caplan
Affiliation:
University of Delaware, Department of Plant and Soil Sciences, Newark, Delaware, United States

Abstract

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Type
Challenges and Advances in Electron Microscopy Research and Diagnosis of Diseases in Humans, Plants and Animals (FIG associated)
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1136 - 1137
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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