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Deep Learning-Based Point-Scanning Super-Resolution Microscopy
Published online by Cambridge University Press: 30 July 2021
Abstract
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- Type
- Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
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- Copyright
- Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America
References
Fang, et al. , "Deep learning-based point-scanning super-resolution imaging", Nature Methods, In PressGoogle Scholar
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