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Decoupling Polarization, Crystal Tilt and Symmetry in Epitaxially-Strained Ferroelectric Thin Films Using 4D-STEM

Published online by Cambridge University Press:  05 August 2019

Yu-Tsun Shao
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.
Zhen Chen
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.
Antonio Mei
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA.
Megan Holtz
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA.
Elliot Padgett
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA.
Darrell Schlom
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, NY, USA. Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA.
David A. Muller*
Affiliation:
School of Applied and Engineering Physics, Cornell University, Ithaca, NY, USA. Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA.
*
*Corresponding author: dm24@cornell.edu

Abstract

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Type
Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences
Copyright
Copyright © Microscopy Society of America 2019 

References

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[7]This work is supported by the AFOSR Hybrid Materials MURI, award # FA9550-18-1-0480. Facilities support from the National Science Foundation (DMR-1429155, DMR-1719875)Google Scholar