Hostname: page-component-8448b6f56d-c47g7 Total loading time: 0 Render date: 2024-04-25T05:18:58.324Z Has data issue: false hasContentIssue false
  • English
  • Français

Damage by Induced Electric Field in Beam-sensitive Materials

Published online by Cambridge University Press:  04 August 2017

Nan Jiang
Nan Jiang*
Affiliation:
Department of Physics, Arizona State University, Tempe AZ.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1812 - 1813
Copyright
© Microscopy Society of America 2017 

References

[1] Jiang, N. Report on Progress in Physics 79 2016). p. 016501.Google Scholar
[2] Jiang, N. J. Phys D: Appl. Phys 46 2013). p. 305502.Google Scholar