Hostname: page-component-76fb5796d-2lccl Total loading time: 0 Render date: 2024-04-25T11:17:50.717Z Has data issue: false hasContentIssue false
  • English
  • Français

Correlative UHV-Cryo Transfer Suite: Connecting Atom Probe, SEM-FIB, Transmission Electron Microscopy via an Environmentally-Controlled Glovebox

Published online by Cambridge University Press:  05 August 2019

Julie M. Cairney ,
Ingrid McCarroll ,
Yi-Sheng Chen ,
Katja Eder ,
Takanori Sato ,
Zongwen Liu ,
Alexander Rosenthal  and
Roger Wepf
Julie M. Cairney*
Affiliation:
The Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, Australia.
Ingrid McCarroll
Affiliation:
The Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, Australia.
Yi-Sheng Chen
Affiliation:
The Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, Australia.
Katja Eder
Affiliation:
The Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, Australia.
Takanori Sato
Affiliation:
The Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, Australia.
Zongwen Liu
Affiliation:
The Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, Australia.
Alexander Rosenthal
Affiliation:
Microscopy Solutions Pty Ltd, Australia.
Roger Wepf
Affiliation:
Centre for Microscopy and Microanalysis, The University of Queensland, Brisbane, Australia.
*
*Corresponding author: julie.cairney@sydney.edu.au

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
New Frontiers in Atom Probe Tomography Applications
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2494 - 2495
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Chang, Y et al. , Nature Communications 10 (2019), p. 942.Google Scholar
[2]Scheiber, DK et al. , Ultramicroscopy 194 (2018), p. 89.Google Scholar
[3]Dumitraschkewitz, P et al. , Adv. Eng. Mater. 17 (2017), 1600668, doi:10.1002/adem.201600668.Google Scholar
[4]Chen, Y.S. et al. , Science 355 (2017), p. 1196.Google Scholar
[5]Gerstl, SSA et al. , Microscopy and Microanalysis 23(S1) (2017), p. 612.Google Scholar
[6]Gerstl, S, Wepf, W., Microscopy and Microanalysis 21 (2015), p. 517.Google Scholar
[7]Perea, DE et al. , Scientific Reports 6 (2016), p. 22321.Google Scholar