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Correlative UHV-Cryo Transfer Suite: Connecting Atom Probe, SEM-FIB, Transmission Electron Microscopy via an Environmentally-Controlled Glovebox

Published online by Cambridge University Press:  05 August 2019

Julie M. Cairney*
Affiliation:
The Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, Australia.
Ingrid McCarroll
Affiliation:
The Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, Australia.
Yi-Sheng Chen
Affiliation:
The Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, Australia.
Katja Eder
Affiliation:
The Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, Australia.
Takanori Sato
Affiliation:
The Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, Australia.
Zongwen Liu
Affiliation:
The Australian Centre for Microscopy and Microanalysis, The University of Sydney, Sydney, Australia.
Alexander Rosenthal
Affiliation:
Microscopy Solutions Pty Ltd, Australia.
Roger Wepf
Affiliation:
Centre for Microscopy and Microanalysis, The University of Queensland, Brisbane, Australia.
*
*Corresponding author: julie.cairney@sydney.edu.au

Abstract

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Type
New Frontiers in Atom Probe Tomography Applications
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Chang, Y et al. , Nature Communications 10 (2019), p. 942.Google Scholar
[2]Scheiber, DK et al. , Ultramicroscopy 194 (2018), p. 89.Google Scholar
[3]Dumitraschkewitz, P et al. , Adv. Eng. Mater. 17 (2017), 1600668, doi:10.1002/adem.201600668.Google Scholar
[4]Chen, Y.S. et al. , Science 355 (2017), p. 1196.Google Scholar
[5]Gerstl, SSA et al. , Microscopy and Microanalysis 23(S1) (2017), p. 612.Google Scholar
[6]Gerstl, S, Wepf, W., Microscopy and Microanalysis 21 (2015), p. 517.Google Scholar
[7]Perea, DE et al. , Scientific Reports 6 (2016), p. 22321.Google Scholar