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Correlative, Multi-scale, Lab-based X-ray Tomography: From Millimeters to Nanometers

Published online by Cambridge University Press:  30 July 2020

Robin White  and
Stephen Kelly
Robin White
Affiliation:
Carl Zeiss RMS, Pleasanton, California, United States
Stephen Kelly
Affiliation:
Carl Zeiss RMS, Pleasanton, California, United States

Abstract

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Type
X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1002 - 1003
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Copyright
Copyright © Microscopy Society of America 2020

References

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Usseglio-viretta, F.L.E., Smith, K (2017) Quantitative Microstructure Characterization of a NMC Electrode. ECS Transactions, 77(11), 1095–111810.1149/07711.1095ecstCrossRefGoogle Scholar