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Contributions to High Resolution and In Situ Electron Microscopy

Published online by Cambridge University Press:  01 August 2018

Robert Sinclair
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA, USA.
Yunzhi Liu
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA, USA.
Sangchul Lee
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA, USA.
Ai Leen Koh
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA, USA.
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Abstract

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© Microscopy Society of America 2018 

References

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[16] Koh, A. L., Lee, S. C. Sinclair, R. in Controlled Atmosphere Transmission Electron Microscopy - Principles and Practice (ed. T. W. Hansen and J. B. Wagner Springer International Publishing Switzerland 2016) p. 3.CrossRefGoogle Scholar
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[22] The present research of our group relevant to this paper has been funded by the National Cancer Institute under Grant U54 CA151459 to the Center for Cancer Nanotechnology Excellence and Translation Diagnostics (CCNE-TD) and by the Toyota Research Institute.Google Scholar
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Contributions to High Resolution and In Situ Electron Microscopy
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