Hostname: page-component-cd9895bd7-dk4vv Total loading time: 0 Render date: 2024-12-30T17:07:54.840Z Has data issue: false hasContentIssue false
  • English
  • Français

Contributions to High Resolution and In Situ Electron Microscopy

Published online by Cambridge University Press:  01 August 2018

Robert Sinclair ,
Yunzhi Liu ,
Sangchul Lee  and
Ai Leen Koh
Robert Sinclair
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA, USA.
Yunzhi Liu
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA, USA.
Sangchul Lee
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA, USA.
Ai Leen Koh
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA, USA.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 10 - 11
Copyright
© Microscopy Society of America 2018 

References

[1] Hashimoto, H., etal, J. Phys. Soc. Japan 42 1977 1073.Google Scholar
[2] Hashimoto, H., etal, Jpn J. Appl. Phys. 19 1980) L1.Google Scholar
[3] Iijima, S Ichihashi, T. Phys. Rev. Lett. 56 1986 616.Google Scholar
[4] Smith, D.J., etal, Science 233 1986 872.Google Scholar
[5] Sinclair, R., Yamashita, T. Ponce, F.A. Nature 290 1981 386.Google Scholar
[6] Sinclair, R., et al, Nature 298 1982 127.Google Scholar
[7] Sinclair, R. Parker, M.A. Nature 322 1986 531.Google Scholar
[8] Sinclair, R., et al, Acta Crystallogr. Sec. A 44 1988 965.Google Scholar
[9] Konno, T.J. Sinclair, R. Philos. Mag. B 71 1995 179.Google Scholar
[10] Ko, D.H. Sinclair, R. Ultramicroscopy 54 1994 166.Google Scholar
[11] Konno, T.J. Sinclair, R. Materials Science Forum. 204-206 1996 749.Google Scholar
[12] Min, K.-H., et al, Philos. Mag. 85 2005 2049.Google Scholar
[13] Sinclair, R. Res, Mat. Soc. Bull 38 2013 1065.Google Scholar
[14] Hashimoto, H., Tanaka, K. Yoda, E J. Electron. Microsc. 6 1958 8.Google Scholar
[15] Hashimoto, H., et al, Jpn. J. Appl. Phys. 7 1968 946.Google Scholar
[16] Koh, A. L., Lee, S. C. Sinclair, R. in Controlled Atmosphere Transmission Electron Microscopy - Principles and Practice (ed. T. W. Hansen and J. B. Wagner Springer International Publishing Switzerland 2016) p. 3.Google Scholar
[17] Creemer, J.F., et al, Ultramicroscopy 108 2008 993.Google Scholar
[18] de Jonge, N. Ross, F.M. Nature Nanotech. 6 2011 695.Google Scholar
[19] Boyes, E.D. Gai, P.L. Ultramicroscopy 67 1997 219.Google Scholar
[20] Koh, A.L., et al, Nanoscale 8 2016 16405.Google Scholar
[21] Koh, A.L. Sinclair, R. Ultramicroscopy 176 2017 132.Google Scholar
[22] The present research of our group relevant to this paper has been funded by the National Cancer Institute under Grant U54 CA151459 to the Center for Cancer Nanotechnology Excellence and Translation Diagnostics (CCNE-TD) and by the Toyota Research Institute.Google Scholar