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Considerations for Secondary Electron Imaging of Dielectric Materials in Low- Vacuum and Environmental SEM

Published online by Cambridge University Press:  01 August 2002

B.L. Thiel  and
M. Toth
B.L. Thiel
Affiliation:
Polymers and Colloids Group, Cavendish Laboratory, University of Cambridge, Cambridge CB3 0HE, UK
M. Toth
Affiliation:
Polymers and Colloids Group, Cavendish Laboratory, University of Cambridge, Cambridge CB3 0HE, UK

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 448 - 449
Copyright
Copyright © Microscopy Society of America 2002