Hostname: page-component-848d4c4894-tn8tq Total loading time: 0 Render date: 2024-07-02T00:24:04.151Z Has data issue: false hasContentIssue false
  • English
  • Français

Comparison of Dislocation Mapping Using Electron Channeling Contrast Imaging and Cross-Correlation Electron Backscattered Diffraction

Published online by Cambridge University Press:  04 August 2017

Bret E. Dunlap ,
Timothy J. Ruggles ,
David T. Fullwood  and
Martin A. Crimp
Bret E. Dunlap
Affiliation:
Michigan State University, Chemical Engineering and Materials Science, East Lansing, MI, USA
Timothy J. Ruggles
Affiliation:
National Institute of Aerospace, Hampton, VA, USA
David T. Fullwood
Affiliation:
Brigham Young University, Mechanical Engineering, Provo, UT, USA
Martin A. Crimp
Affiliation:
Michigan State University, Chemical Engineering and Materials Science, East Lansing, MI, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 546 - 547
Copyright
© Microscopy Society of America 2017 

References

[1] OpenXY, URL: https://github.com/BYU-MicrostructureOfMaterials/OpenXY.Google Scholar
[2] Adams, B. & Kacher, J. Computers, Materials and Continua 14 2009). p. 188.Google Scholar