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Combining 3D X-ray Techniques; Computed Tomography and Fluorescence

Published online by Cambridge University Press:  01 August 2018

Brian M. Patterson ,
Nikolaus Cordes ,
George J. Havrilla  and
Kevin Henderson
Brian M. Patterson
Affiliation:
Materials Science and Technology Division, Engineered Materials Group, Los Alamos National Laboratory, Los Alamos, NM, USA
Nikolaus Cordes
Affiliation:
Materials Science and Technology Division, Engineered Materials Group, Los Alamos National Laboratory, Los Alamos, NM, USA
George J. Havrilla
Affiliation:
Chemical Diagnostics and Engineering, Chemistry Division, Los Alamos National Laboratory, Los Alamos, NM, USA
Kevin Henderson
Affiliation:
Materials Science and Technology Division, Engineered Materials Group, Los Alamos National Laboratory, Los Alamos, NM, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 992 - 993
Copyright
© Microscopy Society of America 2018 

References

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[2] Cordes, N. L., Seshadri, S., Havrilla, G., Yuan, X., Feser, M. Patterson, B. M. Spectrochimica Acta Part B: Atomic Spectroscopy vol. 103-104 2015.Google Scholar
[3] Cordes, N. L., Havrilla, G. J., Usov, I. O., Obrey, K. A. Patterson, B. M. Spectrochimica Acta Part B: Atomic Spectroscopy vol. 101, pp. 320–329, 2014.Google Scholar
[4] Havrilla, G. J. Miller, T. Powder Diffraction vol. 19, pp. 119–126, 2012.Google Scholar