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Collection Efficiency of the Twin EDS Detectors for Quantitative X-ray Analysis on A New Probe-Corrected TEM/STEM

Published online by Cambridge University Press:  04 August 2017

Jane Y. Howe
Affiliation:
Hitachi High-Technologies America Inc., Clarksburg, USA.
Tarunika Ramprasad
Affiliation:
Department of Materials Science and Engineering, University of Arizona, USA.
Akinari Hanawa
Affiliation:
Hitachi High Technologies Co., Hitachinaka, Japan.
Hiromi Inada
Affiliation:
Hitachi High Technologies Co., Hitachinaka, Japan.
Jose Jimenez
Affiliation:
Hitachi High-Technologies America Inc., Clarksburg, USA.
David Hoyle
Affiliation:
Hitachi High Technologies Canada Inc., Toronto, Canada.
Edgar Voelkl
Affiliation:
Hitachi High-Technologies America Inc., Clarksburg, USA.
Thomas J. Zega
Affiliation:
Department of Materials Science and Engineering, University of Arizona, USA. Lunar and Planetary Laboratory, University of Arizona, USA.
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© Microscopy Society of America 2017 

References

[1] Zaluzec, NJ Microsc Microanal 2013 19(S2), 1262.CrossRefGoogle Scholar
[2] Zaluzec, NJ Microsc Microanal 2014 20, 1318.CrossRefGoogle Scholar
[3] Zaluzec, NJ, DesOrmeaux, JP & Roussie, J Microsc Microanal 2016 22(S3), 322.CrossRefGoogle Scholar
[4] Research supported by NSF grant number 1531243 and NASA grant numbers NNX15AJ22G and NNX12AL47G. The work was carried out at the Kuiper Core Imaging and Microscopy Facility, University of Arizona. We thank Dr. Nestor Zaluzec for the insightful discussions..Google Scholar
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Collection Efficiency of the Twin EDS Detectors for Quantitative X-ray Analysis on A New Probe-Corrected TEM/STEM
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