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Chemical Bonding State Analysis with High Energy-resolution Carbon K-Emission Spectrum of Soft Materials Obtained by Soft X-ray Emission Spectrometer

Published online by Cambridge University Press:  22 July 2022

Masaru Takakura
Affiliation:
SA Business Unit JEOL Ltd. 3-1-2 Musashino, Akishima, Tokyo, Japan
Takanori Murano
Affiliation:
SA Business Unit JEOL Ltd. 3-1-2 Musashino, Akishima, Tokyo, Japan
Shogo Koshiya
Affiliation:
SA Business Unit JEOL Ltd. 3-1-2 Musashino, Akishima, Tokyo, Japan
Peter McSwiggen
Affiliation:
JEOL USA Inc., 11 Dearborn Road, Peabody, MA, United States
Vernon Robertson
Affiliation:
JEOL USA Inc., 11 Dearborn Road, Peabody, MA, United States

Abstract

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Type
On Demand - Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens
Copyright
Copyright © Microscopy Society of America 2022

References

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