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Charge - Ordered Manganeese Oxide Studied By Ω - Filter - Angular Resolved EELS

Published online by Cambridge University Press:  02 July 2020

Y. Murooka ,
N. Tanaka ,
M. Hibino ,
K. Tsuda  and
M. Tanaka
Y. Murooka
Affiliation:
CIRSE, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464-8603, Japan
N. Tanaka
Affiliation:
Department of Applied Physics, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464-8603, Japan
M. Hibino
Affiliation:
CIRSE, Nagoya University, Furo-cho, Chikusa-ku, Nagoya, 464-8603, Japan
K. Tsuda
Affiliation:
Research Institute for Scientific Measurements, Tohoku University, Sendai, 980-77, Japan
M. Tanaka
Affiliation:
Research Institute for Scientific Measurements, Tohoku University, Sendai, 980-77, Japan
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Abstract

Despite of the intensive studies, Colossal Magnetoresistance (CMR) phenomena occurring in manganese oxides is still not fully understood. Theoretical studies based on an ordered crystal phase such as the charge-ordering (CO) phase have shown some successes in reproducing experimental evidences. Recently it was, however, shown that such a CO phase included giant clusters which were as large as 100 nm. This indicates the importance of the nanometer-scale information about the electronic structure to understand the CO. La0.5Sr1.5MnO4 is one of the oxides under intense investigations. in the CO phase, the eg valence electrons were found to be ordered at Mn sites. The optical responses of the CO clusters, however, has not been studied. in this study we have attempted to obtain such information from CO clusters in La0.5Sr1.5MnO4 by angular-resolved electron-energy-loss-spectroscopy (EELS) using an in-column type Ω-spectrometer.

Type
EELS Microanalysis at High Sensitivity: Advances in Spectrum Imaging, Energy Filtering and Detection (Organized by R. Leapman and J. Bruley)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 1146 - 1147
Copyright
Copyright © Microscopy Society of America 2001

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References

References:

1Tokura, Y. et al J. Appl. Phys. 79 (1996) 5288.CrossRefGoogle Scholar
2Uehara, M. et al, Nature 399 (1999) 560.CrossRefGoogle Scholar
3Murakami, Y. et al, Phys. Rev. Lett. 80 (1998) 1932.CrossRefGoogle Scholar
4Kimoto, K. et al, J. Electron Microsc. 46 (1997) 369.CrossRefGoogle Scholar
5Botton, G. and Humphreys, C. J. 28 (1997) 313.Google Scholar