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Characterizing Dzyaloshinskii Domain Walls in Asymmetric [Pt/Co/Ni/Ir]N Multi-Layers using Lorentz TEM
Published online by Cambridge University Press: 01 August 2018
Abstract
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- Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 948 - 949
- Copyright
- © Microscopy Society of America 2018
References
[5] Authors acknowledge the support by grant MCF-677785, Materials Characterization Facility at Carnegie Mellon University.Google Scholar
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