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Characterizing Atomic Ordering in Intermetallic Compounds Using X-ray Energy Dispersive Spectroscopy in an Aberration-Corrected (S)TEM

Published online by Cambridge University Press:  25 July 2016

Robert Williams ,
Anna Carlsson ,
Arda Genҫ ,
John Sosa ,
David McComb  and
Hamish Fraser
Robert Williams
Affiliation:
Center for the Accelerated Maturation of Materials. Department of Materials Science and Engineering, The Ohio State University, 1305 Kinnear Road, Columbus, OHUSA
Anna Carlsson
Affiliation:
FEI Company, Achtseweg Noord 5, Eindhoven, The Netherlands
Arda Genҫ
Affiliation:
FEI Company, 5350 NE Dawson Creek Drive, Hillsboro, Oregon
John Sosa
Affiliation:
Center for the Accelerated Maturation of Materials. Department of Materials Science and Engineering, The Ohio State University, 1305 Kinnear Road, Columbus, OHUSA
David McComb
Affiliation:
Center for the Accelerated Maturation of Materials. Department of Materials Science and Engineering, The Ohio State University, 1305 Kinnear Road, Columbus, OHUSA
Hamish Fraser
Affiliation:
Center for the Accelerated Maturation of Materials. Department of Materials Science and Engineering, The Ohio State University, 1305 Kinnear Road, Columbus, OHUSA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1266 - 1267
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Hou, D.H., Jones, I.P. & Fraser, K.L. The Ordering Tie-Line Method for Sublattice Occupancy in Intermetallic Compounds (1996). Phil. Mag. A74, 741.Google Scholar
[2] Forbes, B., et al, The Contribution of Thermally Scattered Electron to Atomic Resolution Maps (2012). Phys. Rev. B. 86, 024108.Google Scholar