Hostname: page-component-7c8c6479df-ph5wq Total loading time: 0 Render date: 2024-03-29T07:13:12.642Z Has data issue: false hasContentIssue false

Characterization of Semiconductor Materials Using Electron Holography

Published online by Cambridge University Press:  04 August 2017

Lin Zhou
Affiliation:
Ames Laboratory, Ames, IA 50014, USA
Zhaofeng Gan
Affiliation:
Intel Corporation, Hillsboro, OR 97124, USA
Myung-Geun Han
Affiliation:
Brookhaven National Laboratory, Upton, NY 11973, USA
David J. Smith
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287, USA
Martha R. McCartney
Affiliation:
Department of Physics, Arizona State University, Tempe, AZ 85287, USA

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2017 

References

[1] McCartney, M.R. & Smith, D.J. Annu. Rev. Mater. Sci 37 2007). p 729.Google Scholar
[2] Han, M.-G., etal, IEEE Trans. Electron Devices 54 2007). p 3336.CrossRefGoogle Scholar
[3] Zhou, L., et a.l, Appl. Phys. Lett. 94 2009 121909.Google Scholar
[4] Gan, Z., et al, Nano Lett. 16 2016). p 3748.Google Scholar
[5] The authors acknowledge the use of facilities in the John M. Cowley Center for High Resolution Electron Microscopy at Arizona State University.Google Scholar