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Characterization of embedded metallic nanoparticles in oxides by cross-coupling aberration-corrected STEM and Atom Probe Tomography

Published online by Cambridge University Press:  23 November 2012

A. Devaraj ,
R. Colby ,
V. Shutthanandan ,
V. Subramanian ,
C. Wang ,
D.E. Perea  and
S. Thevuthasan
A. Devaraj
Affiliation:
Environmental Molecular Science Laboratory, Pacific Northwest National Lab, Richland, WA
R. Colby
Affiliation:
Environmental Molecular Science Laboratory, Pacific Northwest National Lab, Richland, WA
V. Shutthanandan
Affiliation:
Environmental Molecular Science Laboratory, Pacific Northwest National Lab, Richland, WA
V. Subramanian
Affiliation:
Environmental Molecular Science Laboratory, Pacific Northwest National Lab, Richland, WA
C. Wang
Affiliation:
Environmental Molecular Science Laboratory, Pacific Northwest National Lab, Richland, WA
D.E. Perea
Affiliation:
Environmental Molecular Science Laboratory, Pacific Northwest National Lab, Richland, WA
S. Thevuthasan
Affiliation:
Environmental Molecular Science Laboratory, Pacific Northwest National Lab, Richland, WA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 912 - 913
Copyright
Copyright © Microscopy Society of America 2012

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