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Characterization of Alpha/Beta Interface Structure in a Titanium Alloy Using Aberration-Corrected Scanning Transmission Electron Microscope

Published online by Cambridge University Press:  25 July 2016

Yufeng Zheng ,
Robert E. A. Williams ,
William A.T. Clark  and
Hamish L. Fraser
Yufeng Zheng
Affiliation:
Department of Materials Science and Engineering, The Ohio State University
Robert E. A. Williams
Affiliation:
Department of Materials Science and Engineering, The Ohio State University
William A.T. Clark
Affiliation:
Department of Materials Science and Engineering, The Ohio State University
Hamish L. Fraser
Affiliation:
Department of Materials Science and Engineering, The Ohio State University

Abstract

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Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1974 - 1975
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Burgers, W.G. Physica 1 (1934) 561–586.CrossRefGoogle Scholar
[2] Nag, S., et al, Acta Mater 60 (2012) 6247–6256.CrossRefGoogle Scholar
[3] Zheng, Y., et al, Scripta Mater 111 (2016) 81–84.Google Scholar
[4] Zheng, Y., et al, Acta Mater 103 (2016) 165–173.CrossRefGoogle Scholar
[5] Zheng, Y., et al, Acta Mater 103 (2016) 850–858.CrossRefGoogle Scholar
[6] Hirth, J.P. & Pond, R.C. JPMS Progress in Materials Science 56 (2011) 586–636.CrossRefGoogle Scholar
[7] Zheng, Y., et al, Scripta Materialia 113 (2016) 202–205.CrossRefGoogle Scholar
[8] Zheng, Y., et al, Scripta Materialia 116 (2016) 49–52.CrossRefGoogle Scholar