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Article contents
Challenges and Applications of High Spatial and Energy Resolution EELS for Mapping Functional Chemistry in Beam-Sensitive Materials at Low Acceleration Voltages
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[6]SuperSTEM is the UK National Research Facility for Advanced Electron Microscopy, supported by the Engineering and Physical Sciences Research Council (EPSRC).Google Scholar