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Challenges and Applications of High Spatial and Energy Resolution EELS for Mapping Functional Chemistry in Beam-Sensitive Materials at Low Acceleration Voltages

Published online by Cambridge University Press:  05 August 2019

Quentin Ramasse*
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom School of Chemical and Process Engineering and School of Physics, University of Leeds, Leeds, United Kingdom
Demie Kepaptsoglou
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom Department of Physics and JEOL Nanocentre, University of York, York, United Kingdom
Christian Vollmer
Affiliation:
Institut für Mineralogie, Westfälische Wilhelms-Universität, Münster, Germany
Fredrik Hage
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom
Patricia Abellan
Affiliation:
SuperSTEM Laboratory, SciTech Daresbury Campus, Daresbury, United Kingdom
Jan Leitner
Affiliation:
Max Planck Institute for Chemistry, Mainz, Germany
*
*Corresponding author: qmramasse@superstem.org
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Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Ramasse, Q, Ultramicroscopy 180 (2017), p. 41.CrossRefGoogle Scholar
[2]Hage, F. et al. , Submitted (2019).Google Scholar
[3]Susi, T et al. , 2D Materials 4, 042004 (2017)CrossRefGoogle Scholar
[4]Vollmer, C et al. , Meteoritics & Planetary Science 53(S1) (2018), p. 6109.Google Scholar
[5]Vollmer, C et al. , Submitted (2019).Google Scholar
[6]SuperSTEM is the UK National Research Facility for Advanced Electron Microscopy, supported by the Engineering and Physical Sciences Research Council (EPSRC).Google Scholar
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Challenges and Applications of High Spatial and Energy Resolution EELS for Mapping Functional Chemistry in Beam-Sensitive Materials at Low Acceleration Voltages
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