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Defects in Materials: How We See and Understand Them
Spence, J.C.H., Zuo, J.M., Does electron holography energy-filter?, Ultramicroscopy, 69 (1997) 185-190.CrossRefGoogle Scholar
[2]
Padgett, E., Holtz, M.E., Cueva, P., Shao, Y.-T., Langenberg, E., Schlom, D.G., Muller, D.A., The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision, Ultramicroscopy, 214 (2020) 112994.CrossRefGoogle ScholarPubMed
[3]
Shao, Y.T., Yuan, R., Hsiao, H.W., Yang, Q., Hu, Y., Zuo, J.M., Cepstral scanning transmission electron microscopy imaging of severe lattice distortions, Ultramicroscopy, Under revision (2020) Preprint at https://arxiv.org/abs/2101.06503.Google Scholar
[4]
Tsai, M.H., Yeh, J.W., High-entropy alloys: a critical review, Materials Research Letters, 2 (2014) 107-123.CrossRefGoogle Scholar
[5]
Miracle, D.B., Senkov, O.N., A critical review of high entropy alloys and related concepts, Acta Materialia, 122 (2017) 448-511.CrossRefGoogle Scholar