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Capturing Reaction Kinetics of Atomically Thin Device Materials by High-throughput in-operando SEM

Published online by Cambridge University Press:  22 July 2022

Ye Fan ,
Ryo Mizuta  and
Stephan Hofmann
Ye Fan
Affiliation:
Electrical Engineering Division, University of Cambridge, Cambridge, United Kingdom
Ryo Mizuta
Affiliation:
Electrical Engineering Division, University of Cambridge, Cambridge, United Kingdom
Stephan Hofmann*
Affiliation:
Electrical Engineering Division, University of Cambridge, Cambridge, United Kingdom
*
*Corresponding author: sh315@cam.ac.uk

Abstract

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Type
From Operando Microcell Experiments to Bulk Devices
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 828
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Copyright
Copyright © Microscopy Society of America 2022

References

Weatherup, et al. , Nano Lett. 16, 6196 (2016)10.1021/acs.nanolett.6b02459CrossRefGoogle Scholar
Wang, et al. , ACS Nano 13, 2114 (2019)Google Scholar
Fan, et al. , Nanoscale 12, 22234 (2020)10.1039/D0NR06459ACrossRefGoogle Scholar
We thank Dr L. Han from Carl Zeiss Ltd. for support in adaptation of the instrumentation.Google Scholar