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Bayesian Analysis of Electron Spectroscopic SEM Images

Published online by Cambridge University Press:  01 August 2018

Jorg Eisele ,
Bernd Schindler ,
Dirk Preikszas  and
Rasmus R. Schroder
Jorg Eisele
Affiliation:
Centre for Advanced Materials (CAM), Universitat Heidelberg, Heidelberg, Germany
Bernd Schindler
Affiliation:
Carl Zeiss Microscopy, Oberkochen, Germany
Dirk Preikszas
Affiliation:
Carl Zeiss Microscopy, Oberkochen, Germany
Rasmus R. Schroder
Affiliation:
Centre for Advanced Materials (CAM), Universitat Heidelberg, Heidelberg, Germany Cryo Electron Microscopy, BioQuant, Universitatsklinikum Heidelberg, Heidelberg, Germany

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 574 - 575
Copyright
© Microscopy Society of America 2018 

References

[1] Schröder, R. R., et al Microscopy and Microanalysis Conference Proceedings of this conference.Google Scholar
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[8]. The authors acknowledge funding of the DELTA project by the German Federal Ministry of Research and Education to RRS (FKZ: 13GW0044).Google Scholar