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Automated image acquisition and analysis of beam sensitive samples

Published online by Cambridge University Press:  04 August 2017

Eric Stach ,
Dmitri N. Zakharov ,
Yuewei Lin ,
Shinjae Yoo  and
Guenter Resch
Eric Stach
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, USA.
Dmitri N. Zakharov
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, USA.
Yuewei Lin
Affiliation:
Computational Sciences Initiative, Brookhaven National Laboratory, Upton, USA.
Shinjae Yoo
Affiliation:
Computational Sciences Initiative, Brookhaven National Laboratory, Upton, USA.
Guenter Resch
Affiliation:
Nexperion, e.U., Vienna, Austria.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1788 - 1789
Copyright
© Microscopy Society of America 2017 

References

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[6] This research used resources of the Center for Functional Nanomaterials, which is a U.S. DOE Office of Science Facility, at Brookhaven National Laboratory under Contract No. DE-SC0012704.Google Scholar