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Auto-encoders for Noise Reduction in Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  04 August 2017

James P. Buban
Affiliation:
Korea Institute of Materials Science, 797 Changwondaero, Seongusan-gu, Changwon, Gyeongnam, South Korea 51508
Si-Young Choi
Affiliation:
Korea Institute of Materials Science, 797 Changwondaero, Seongusan-gu, Changwon, Gyeongnam, South Korea 51508
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© Microscopy Society of America 2017 

References

[1] LeCun, Y, et al, Nature 521 2015). p. 436.CrossRefGoogle Scholar
[2] Vincent, P, et al, Proceeding of the 25th International Conference on Machine Learning (2008) p.1096.Google Scholar
[3] Buban, J, et al, Journal of Electron Microscopy 59 2009). p. 103.CrossRefGoogle Scholar
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