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Atomistic Understanding of Interface Structures and Properties in Self-Assembled and Vertically Aligned Nanocomposite Thin Films by Advanced Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2018

Ping Lu
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
Lin Zhou
Affiliation:
Ames Laboratory, Ames, IA, USA
Jon Ihlefeld
Affiliation:
Department of Materials Science and Engineering, University of Virginia, Charlottesville, VA, USA
Wei Pan
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
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Abstract

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© Microscopy Society of America 2018 

References

[1] Yu, P., Chu, Y.-H. Ramesh, R. Mater. Today 15 2012) p. 320.CrossRefGoogle Scholar
[2] Von Harrach, H.S., et al, Microsc. Microanal. 15(suppl.2 2009) p. 208.CrossRefGoogle Scholar
[3] Lu, P., et al, Microsc. Microanal. 20 2014) p. 1782.CrossRefGoogle Scholar
[4] Lu, P., et al, Sci. Rep. 4 2014) p. 3945.CrossRefGoogle Scholar
[5] Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology and Engineering Solutions of Sandia LLC, a wholly owned subsidiary of Honeywell International Inc., for the U. S. Department of Energy’s National Nuclear Security Administration under contract DE-NA0003525. Authors thank Professors Q.X. Jia (University of Buffalo), H.Y. Wang (Purdue University) and J. L. MacManus-Driscoll (University of Cambridge (UK)) for providing the samples necessary for the work.Google Scholar
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Atomistic Understanding of Interface Structures and Properties in Self-Assembled and Vertically Aligned Nanocomposite Thin Films by Advanced Scanning Transmission Electron Microscopy
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Atomistic Understanding of Interface Structures and Properties in Self-Assembled and Vertically Aligned Nanocomposite Thin Films by Advanced Scanning Transmission Electron Microscopy
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