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Atomic-Scale Mechanisms for Interfacial Radiation Damage Resistance of Thin Film Oxide Heterostructures
Published online by Cambridge University Press: 05 August 2019
Abstract
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- Type
- Microscopy and Microanalysis of Nuclear and Irradiated Materials
- Information
- Copyright
- Copyright © Microscopy Society of America 2019
References
[1]Spurgeon, S. R. et al. Polarization screening-induced magnetic phase gradients at complex oxide interfaces. Nat. Commun. 6, 6735 (2015).Google Scholar
[2]Spurgeon, S. R. & Chambers, S. A. Atomic-Scale Characterization of Oxide Interfaces and Superlattices Using Scanning Transmission Electron Microscopy. in Reference Module in Chemistry, Molecular Sciences and Chemical Engineering 1–11 (Elsevier, 2017).Google Scholar
[3]Sassi, M., Kaspar, T., Rosso, K. M. & Spurgeon, S. R. Effect of structure and composition on the electronic excitation induced amorphization of La2Ti2−xZrxO7 ceramics. (2018). Arxiv: 1812.01136Google Scholar