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Atomic-Resolution Scanning Transmission Electron Microscopy with Segmented Annular All Field Detector

Published online by Cambridge University Press:  27 August 2014

N. Shibata ,
S.D. Findlay  and
Y. Ikuhara
N. Shibata
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656 Japan PRESTO, Japan Science and Technology Agency, Saitama 332-0012, Japan
S.D. Findlay
Affiliation:
School of Physics, Monash University, Victoria 3800, Australia
Y. Ikuhara
Affiliation:
Institute of Engineering Innovation, The University of Tokyo, Tokyo 113-8656 Japan Nanostructures Research Laboratory, Japan Fine Ceramic Center, Nagoya, 456-8587, Japan

Abstract

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Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 64 - 65
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Shibata, N., et al., J. Electron Microscopy 59, 473 (2010).Google Scholar
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[7] We thank Y. Kohno, H. Sawada and Y. Kondo (JEOL Ltd.) for their collaboration in the detector development. This work was supported by the PRESTO, JST and the JSPS KAKENHI Grant number 23686093. A part of this work was conducted in Research Hub for Advanced Nano Characterization, The University of Tokyo, under the support of “Nanotechnology Platform” (project No.12024046) by MEXT, Japan. This research was supported under the Discovery Projects funding scheme of the Australian Research Council (Project No. DP110101570).Google Scholar