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Microscopy and Microanalysis Microscopy and Microanalysis

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Atomic-resolution Observations of Grain Boundary Segregation in Multiphase Ceramics by Aberration-corrected STEM

Published online by Cambridge University Press:  30 July 2020

Komal Syed ,
Mingjie Xu ,
David Kok ,
Kenta Ohtaki ,
William Bowman  and
Martha Mecartney
Komal Syed
Affiliation:
University of California-Irvine, Irvine, California, United States
Mingjie Xu
Affiliation:
University of California-Irvine, Irvine, California, United States
David Kok
Affiliation:
University of California-Irvine, Irvine, California, United States
Kenta Ohtaki
Affiliation:
University of California-Irvine, Irvine, California, United States
William Bowman
Affiliation:
University of California-Irvine, Irvine, California, United States
Martha Mecartney
Affiliation:
University of California-Irvine, Irvine, California, United States
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Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1236 - 1237
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Copyright
Copyright © Microscopy Society of America 2020

References

Kelly, J.P. and Graeve, O.A., JOM 67 (2015 ), 29–3310.1007/s11837-014-1202-xCrossRefGoogle Scholar
Cologna, M., Prette, A.L.G and Raj, R., J. Am. Ceram. Soc. 94 (2011), 316–31910.1111/j.1551-2916.2010.04267.xCrossRefGoogle Scholar
Syed, K. et al. , Microsc. Microanal. 25 (2019), 2352–235310.1017/S1431927619012492CrossRefGoogle Scholar
This work is supported by NSF DMR Thermal Grant 442660-21130, and UCI faculty start up fund. The work was performed in the Irvine Materials Research Institute (IMRI).Google Scholar
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