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Atomic Structure of Superconducting Tunnel Junctions using STEM and APT

Published online by Cambridge University Press:  30 July 2021

Edwin Supple ,
Megan Holtz ,
Christopher J. K. Richardson  and
Brian Gorman
Edwin Supple
Affiliation:
Colorado School of Mines, United States
Megan Holtz
Affiliation:
Colorado School of Mines, United States
Christopher J. K. Richardson
Affiliation:
Laboratory for Physical Sciences, United States
Brian Gorman
Affiliation:
Colorado School of Mines, United States

Abstract

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Type
Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 2460 - 2462
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Müller, C., Lisenfeld, J., Shnirman, A., and Poletto, S., “Interacting two-level defects as sources of fluctuating high-frequency noise in superconducting circuits,” Phys. Rev. B, vol. 92, no. 3, p. 035442, Jul. 2015, doi:10.1103/PhysRevB.92.035442.CrossRefGoogle Scholar
Richardson, C. J. K., Alexander, A., Weddle, C. G., Arey, B., and Olszta, M., “Low-loss superconducting titanium nitride grown using plasma-assisted molecular beam epitaxy,” J. Appl. Phys., vol. 127, no. 23, p. 235302, Jun. 2020, doi: 10.1063/5.0008010.Google Scholar
Nakamura, Y., Terai, H., Inomata, K., Yamamoto, T., Qiu, W., and Wang, Z., “Superconducting qubits consisting of epitaxially grown NbN/AlN/NbN Josephson junctions,” Appl. Phys. Lett., vol. 99, no. 21, p. 212502, Nov. 2011, doi: 10.1063/1.3663539.CrossRefGoogle Scholar
This work was funded by the Laboratory for Physical Sciences under contract #H98230-19-C-0428Google Scholar