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Atomic Scale Structure and Defects in 2D GaSe Films and Van der Waals Interface

Published online by Cambridge University Press:  04 August 2017

Jared M Johnson ,
Choong Hee Lee ,
Sriram Krishnamoorthy ,
Siddharth Rajan  and
Jinwoo Hwang
Jared M Johnson
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH 43212
Choong Hee Lee
Affiliation:
Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH 43210
Sriram Krishnamoorthy
Affiliation:
Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH 43210
Siddharth Rajan
Affiliation:
Department of Electrical and Computer Engineering, The Ohio State University, Columbus, OH 43210
Jinwoo Hwang
Affiliation:
Department of Materials Science and Engineering, The Ohio State University, Columbus, OH 43212

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1728 - 1729
Copyright
© Microscopy Society of America 2017 

References

[1] Krishnamoorthy, S., et al., Appl. Phys. Lett. 109, 183505 2016.Google Scholar
[2] Lee, C. H., et al.(submitted).Google Scholar
[3] Zhou, Y., et al., ACS Nano 8, 1485 2014.Google Scholar