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Atomic Resolution Imaging and Analysis of Graphene at Low Acceleration Voltages using Aberration Corrected Microscope with Cold Field Emission Gun

Published online by Cambridge University Press:  01 August 2018

Hiroki Hashiguchi ,
Ryusuke Sagawa ,
Eiji Okunishi ,
Noriaki Endo  and
Yukihito Kondo
Hiroki Hashiguchi
Affiliation:
JEOL Ltd. 3-1-2 Musashino Akishima, Tokyo, Japan
Ryusuke Sagawa
Affiliation:
JEOL Ltd. 3-1-2 Musashino Akishima, Tokyo, Japan
Eiji Okunishi
Affiliation:
JEOL Ltd. 3-1-2 Musashino Akishima, Tokyo, Japan
Noriaki Endo
Affiliation:
JEOL Ltd. 3-1-2 Musashino Akishima, Tokyo, Japan
Yukihito Kondo
Affiliation:
JEOL Ltd. 3-1-2 Musashino Akishima, Tokyo, Japan

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 128 - 129
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Kohno, Y., et al, Microscopy and Analysis 2010 24(7 p S9.Google Scholar
[2] Ishikawa, T., et al, Microscopy and Microanalysis 2015 21(S3 p 1599.Google Scholar
[3] Kawai, S., et al, Microscopy and Microanalysis 2014 20(S3 p 1150.Google Scholar
[4] Suenaga, K., et al, Nature 468 2010) p 1088.Google Scholar