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Atomic Resolution Convergent Beam Electron Diffraction Analysis Using Convolutional Neural Networks

Published online by Cambridge University Press:  05 August 2019

Chenyu Zhang
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, USA.
Jie Feng
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, USA.
Luis Rangel DaCosta
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, USA.
Paul M. Voyles
Affiliation:
Department of Materials Science and Engineering, University of Wisconsin-Madison, Madison, WI, USA.
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Abstract

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Type
Data Acquisition Schemes, Machine Learning Algorithms, and Open Source Software Development for Electron Microscopy
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Xu, W and LeBeau, JM, Ultramicroscopy 188 (2018), p. 59.CrossRefGoogle Scholar
[2]Lebeau, JM et al. , Phys. Rev. Lett. 100 (2008), p. 1.CrossRefGoogle Scholar
[3]Krizhevsky, A, Sutskever, I and Hinton, GE, Adv. Neural Inf. Process. Syst. (2012).Google Scholar
[4]Pryor, A, Ophus, C and Miao, J, Adv. Struct. Chem. Imaging (2017). doi:10.1186/s40679-017-0048-zGoogle Scholar
[5]This work was support by the US Department of Energy, Basic Energy Sciences (DE-FG02-08ER46547) and used facilities support by the Wisconsin MRSEC (DMR-1720415).Google Scholar
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