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Atomic Force Microscopy (AFM) Imaging and Force Recognition at the Molecular Level in Bacteria

Published online by Cambridge University Press:  01 August 2004

David P. Allison ,
Claretta J. Sullivan ,
Jennifer L. Morrell ,
Peter R. Hoyt  and
Mitchel J. Doktycz
David P. Allison
Affiliation:
University of Tennessee Knoxville
Claretta J. Sullivan
Affiliation:
University of Tennessee Knoxville
Jennifer L. Morrell
Affiliation:
University of Tennessee Knoxville
Peter R. Hoyt
Affiliation:
University of Tennessee Knoxville
Mitchel J. Doktycz
Affiliation:
Oak Ridge National Laboratory, Tennessee
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 1094 - 1095
Copyright
© 2004 Microscopy Society of America

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