Skip to main content Accessibility help
×
Home
Hostname: page-component-544b6db54f-8tjh8 Total loading time: 0.141 Render date: 2021-10-22T04:27:22.118Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true, "newUsageEvents": true }

Application of Low kV EELS to Problematic Samples

Published online by Cambridge University Press:  05 August 2019

Eric V. Formo
Affiliation:
Georgia Electron Microscopy, University of Georgia, Athens, Georgia, USA.
Jane Y. Howe
Affiliation:
Hitachi High Technologies America Inc., Clarksburg, Maryland, USA.
Takeshi Sunaoshi
Affiliation:
Hitachi High Technologies America Inc., Clarksburg, Maryland, USA.
Atsushi Muto
Affiliation:
Hitachi High Technologies America Inc., Clarksburg, Maryland, USA.
Jim Kilcrease
Affiliation:
Hitachi High Technologies America Inc., Clarksburg, Maryland, USA.
Tina Salguero
Affiliation:
Georgia Electron Microscopy, University of Georgia, Athens, Georgia, USA. Department of Chemistry, University of Georgia, Athens, Georgia, USA.
Rights & Permissions[Opens in a new window]

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Low Voltage, Low Energy Electron Microscopy Imaging and Analysis
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Egerton, RF, Rep. Prog. Phys. 72 (2009), 016502.CrossRefGoogle Scholar
[2]Yamazawa, Y, et al. , Microsc. Microanal. 22 Suppl 3 (2016), 50.CrossRefGoogle Scholar
[3]Sunaoshi, T, et al. , Microsc. Microanal. 22 Suppl 3 (2016), 604.CrossRefGoogle Scholar
[4]Brodusch, N, et al. , Ultramicroscopy (2018), https://doi.org//10.1016/j.ultramic.2018.12.015.Google Scholar
[5]Ramachandran, R and Salguero, TT, Inorg. Chem. 57 (2018), 4.CrossRefGoogle Scholar
[6]Wei, B, et al. , ACS Appl. Energy Mater. 1 (2018), 3180.CrossRefGoogle Scholar
[7]Kitta, M.; Akita, T.; Tanaka, S.; Kohyama, M. J. Power Sources 237 (2013), 26.CrossRefGoogle Scholar
[8]Chen, C and Thompson, A, Environ. Sci. Technol. 52 (2018), 597.CrossRefGoogle Scholar
[9]Tishchenko, V, et al. , Geochim. Cosmochim. Acta 148 (2015), 191.CrossRefGoogle Scholar
[10]Special thanks to Dr. Roshini Ramachandran for preparing the LaB6 sample, to Mayra Pedraza for preparing the Li4Ti5O12 sample, and to Prof. Aaron Thompson for providing the soil sample for analysis.Google Scholar
You have Access

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Application of Low kV EELS to Problematic Samples
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Application of Low kV EELS to Problematic Samples
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Application of Low kV EELS to Problematic Samples
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *