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Application of Atom Probe Tomography to Nitride Semiconductors

Published online by Cambridge University Press:  04 August 2017

Rachel A. Oliver ,
Fengzai Tang ,
Samantha E. Bennett ,
Tomas L. Martin ,
Paul A.J. Bagot ,
GDW Smith  and
Michael P. Moody
Rachel A. Oliver
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, United Kingdom
Fengzai Tang
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, United Kingdom
Samantha E. Bennett
Affiliation:
Department of Materials Science and Metallurgy, University of Cambridge, 27 Charles Babbage Road, Cambridge, CB3 0FS, United Kingdom
Tomas L. Martin
Affiliation:
Departments of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom
Paul A.J. Bagot
Affiliation:
Departments of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom
GDW Smith
Affiliation:
Departments of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom
Michael P. Moody
Affiliation:
Departments of Materials, University of Oxford, Parks Road, Oxford, OX1 3PH, United Kingdom

Abstract

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Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 666 - 667
Copyright
© Microscopy Society of America 2017 

References

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