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Application of Atom Probe Tomography to Nitride Semiconductors
Published online by Cambridge University Press: 04 August 2017
Abstract
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- Type
- Abstract
- Information
- Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 666 - 667
- Copyright
- © Microscopy Society of America 2017
References
[11]
Rigutti, L, et al, Scripta Materialia
2017). In Press. DOI: 10.1016/j.scriptamat.2016.12.034.Google Scholar