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Analysis of the Defect Chemistry at Gd-Doped Ceria Grain Boundaries

Published online by Cambridge University Press:  02 July 2020

Y. Ito ,
Y. Lei ,
N.D. Browning  and
T.J. Mazanec
Y. Ito
Affiliation:
Department of Physics, University of Illinois, 845 W. Taylor St., Chicago, IL60607-7059
Y. Lei
Affiliation:
Department of Physics, University of Illinois, 845 W. Taylor St., Chicago, IL60607-7059
N.D. Browning
Affiliation:
Department of Physics, University of Illinois, 845 W. Taylor St., Chicago, IL60607-7059
T.J. Mazanec
Affiliation:
BP Amoco Chemicals, 150 West Warrenville Road, P.O. Box 3011, Naperville, IL60566-7011
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Abstract

Gd3+ doped Ce oxides are very promising candidates as electrolytes for solid oxide fuel cells operating at ∼ 500 °C. For their successful commercial implementation, a full understanding of the defect chemistry in the bulk and at grain boundaries is essential. in particular, the contribution of the grain boundaries to the total ionic conductivity through such effects as the segregation of impurities, dopants and vacancies is of crucial importance. Here the effect of the atomic structure on the local electronic properties, i.e. oxygen coordination and cation valence at grain boundaries of the fluorite structured Gd0.2Ce0.8O2-x ceramic electrolyte is investigated by a combination of Z-contrast imaging and electron energy loss spectroscopy (EELS) in the JEOL 201 OF STEM (operating at 200keV, and aligned for a probe size ∼ 0.2 nm).

Preliminary O K- and Ce M45-edges were acquired from points in the grains (A and B) and grain boundary shown in Figure 1.

Type
EELS Microanalysis at High Sensitivity: Advances in Spectrum Imaging, Energy Filtering and Detection (Organized by R. Leapman and J. Bruley)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 1184 - 1185
Copyright
Copyright © Microscopy Society of America 2001

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References

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