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An Information Technology Solution to Enable Remote Training and Operation of Instruments with Out-dated Operating Systems

Published online by Cambridge University Press:  30 July 2021

Jennifer Carter ,
Jeffrey Pigott ,
Tae Kyong John Kim  and
Steven Waring
Jennifer Carter
Affiliation:
Swagelok Center for Surface Analysis of Materials, Case Western Reserve University, Cleveland, Ohio, United States
Jeffrey Pigott
Affiliation:
Swagelok Center for Surface Analysis of Materials, Case Western Reserve University, Cleveland, Ohio, United States
Tae Kyong John Kim
Affiliation:
Swagelok Center for Surface Analysis of Materials, Case Western Reserve University, United States
Steven Waring
Affiliation:
Client Platforms, University Technology [u]Tech, Case Western Reserve University, United States

Abstract

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Type
Full System and Workflow Automation for Enabling Big Data and Machine Learning in Electron Microscopy
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 1628 - 1629
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Owen, G., “Purchasing an electron microscope? – Considerations and scientific strategies to help in the decision making process,” Wiley Analytical Science, 2018. https://analyticalscience.wiley.com/do/10.1002/micro.2610 (accessed Feb. 24, 2021).Google Scholar