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An Improved EPMA Method for Gaining High Precision and High Accuracy Determination of Trace Elements in Quartz

Published online by Cambridge University Press:  05 August 2019

Shui-Yuan Yang ,
Ji-Qiang Cui ,
Shao-Yong Jiang  and
Jing Xie
Shui-Yuan Yang
Affiliation:
State Key Laboratory of Geological Processes and Mineral Resources, China University of Geosciences, Wuhan, PRChina
Ji-Qiang Cui
Affiliation:
State Key Laboratory of Geological Processes and Mineral Resources, China University of Geosciences, Wuhan, PRChina
Shao-Yong Jiang
Affiliation:
State Key Laboratory of Geological Processes and Mineral Resources, China University of Geosciences, Wuhan, PRChina Faculty of Earth Resources and Collaborative Innovation Center for Scarce and Strategic Mineral Resources, China University of Geosciences, Wuhan, PRChina
Jing Xie
Affiliation:
Key Laboratory of Continental Collision and Plateau Uplift, Institute of Tibetan Plateau Research, Chinese Academy of Sciences, Beijing, PRChina

Abstract

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Type
Applications of Integrated Electron Probe Microscopy and Microanalysis Techniques in Characterizing Natural and Synthetic Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2318 - 2319
Copyright
Copyright © Microscopy Society of America 2019 

References

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[9]This work was supported by the National Key R&D Plan of China (No. 2017YFC0601404) and the National Natural Science Foundation of China (No. 41773040).Google Scholar