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Alternate Technique To Measure ϕ(ρz) Curves Of Insulator Orcompound

Published online by Cambridge University Press:  02 July 2020

D. Drouin  and
C. Nockolds
D. Drouin
Affiliation:
Département de génie électrique et génie informatique, Université de Sherbrooke, Sherbrooke, Québec, CANADAJ1K 2R1
C. Nockolds
Affiliation:
Electron Microscope Unit, Madsen Building F09, University of Sydney, NSW 2006, Australia
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Extract

The ϕ(ρz) method is commonly used in quantitative X-ray microanalysis to calculate the proper correction for absorption and atomic number. Several models are used to reproduce generated X-ray intensity as a function of mass thickness. Those models rely on equations which has been adjusted to fit experimental measurement of the ϕ(ρz) curves. The classical tracer method for the experimental measurement of ϕ(ρz) curves proposed by Castaing (1951). The limitations of this method are related to the fabrication steps of the sample. The successive layers must be deposited in thin uniform layers of the same mass thickness and must be the same composition as the substrate.

The method described here, first proposed by J. Cazaux, uses the effect of self-absorption in a bulk sample to determine the generated intensity. The basic idea is to produce a set of equations for several absorption conditions while maintaining a constant geometry for the x-ray generation.

Type
Quantitative X-Ray Microanalysis
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 76 - 77
Copyright
Copyright © Microscopy Society of America

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References

1.Packwood, and Brown, (1981). X-Ray Spectrom. 10, 138.CrossRefGoogle Scholar
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