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Advantages of Beam Deceleration for Low kV EDS Analysis

Published online by Cambridge University Press:  23 September 2015

D. Edwards
Affiliation:
JEOL, USA Inc., 11 Dearborn Rd, Peabody, MA 01960
N. Erdman
Affiliation:
JEOL, USA Inc., 11 Dearborn Rd, Peabody, MA 01960
D. Guarrera
Affiliation:
JEOL, USA Inc., 11 Dearborn Rd, Peabody, MA 01960
M. Shibata
Affiliation:
JEOL, USA Inc., 11 Dearborn Rd, Peabody, MA 01960
V. Robertson
Affiliation:
JEOL, USA Inc., 11 Dearborn Rd, Peabody, MA 01960
F. Timischl
Affiliation:
JEOL Technics Ltd, Akishima, Japan
Y. Nemoto
Affiliation:
JEOL Technics Ltd, Akishima, Japan
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Abstract

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Copyright
Copyright © Microscopy Society of America 2015 

References

[1] [2] Bell, D.C. & Erdman, N., in Low Voltage Electron Microscopy: Principles and Applications (2012) 130.Google Scholar
[2] Rowlands, N., et al., Microscopy and Microanalysis 15(S2 (2009) 548549.CrossRefGoogle Scholar
[3] Edwards, D., et al., Microscopy and Microanalysis 20(S3 (2014) 646647.CrossRefGoogle Scholar
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