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Accurate Determination of Grain Boundary Coverages of Segregating Elements by STEM X-ray Mapping Combined with the ζ-Factor Method

Published online by Cambridge University Press:  21 July 2003

M. Watanabe  and
D.B. Williams
M. Watanabe
Affiliation:
Dept. of Materials Science and Engineering, Lehigh University, Bethlehem, PA18015, US
D.B. Williams
Affiliation:
Dept. of Materials Science and Engineering, Lehigh University, Bethlehem, PA18015, US

Abstract

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Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 668 - 669
Copyright
Copyright © Microscopy Society of America 2003