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Use of an Annular Silicon Drift Detector (SDD) Versus a Conventional SDD Makes Phase Mapping a Practical Solution for Rare Earth Mineral Characterization

Published online by Cambridge University Press:  04 June 2018

Chaoyi Teng ,
Hendrix Demers ,
Nicolas Brodusch ,
Kristian Waters  and
Raynald Gauvin
Chaoyi Teng*
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada, H3A 0C5
Hendrix Demers
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada, H3A 0C5
Nicolas Brodusch
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada, H3A 0C5
Kristian Waters
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada, H3A 0C5
Raynald Gauvin
Affiliation:
Department of Mining and Materials Engineering, McGill University, Montreal, Quebec, Canada, H3A 0C5
*
*Author for correspondence: Chaoyi Teng, chaoyi.teng@mail.mcgill.ca
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Abstract

A number of techniques for the characterization of rare earth minerals (REM) have been developed and are widely applied in the mining industry. However, most of them are limited to a global analysis due to their low spatial resolution. In this work, phase map analyses were performed on REM with an annular silicon drift detector (aSDD) attached to a field emission scanning electron microscope. The optimal conditions for the aSDD were explored, and the high-resolution phase maps generated at a low accelerating voltage identify phases at the micron scale. In comparisons between an annular and a conventional SDD, the aSDD performed at optimized conditions, making the phase map a practical solution for choosing an appropriate grinding size, judging the efficiency of different separation processes, and optimizing a REM beneficiation flowsheet.

Keywords

annular silicon drift detectorfield emission scanning electron microscopephase maprare earth mineralsX-ray microanalysis
Type
Materials Science Applications
Information
Microscopy and Microanalysis , Volume 24 , Issue 3 , June 2018 , pp. 238 - 248
Copyright
© Microscopy Society of America 2018 

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Footnotes

Cite this article: Teng C, Demers H, Brodusch N, Waters K, Gauvin R (2018) Use of an Annular Silicon Drift Detector (SDD) Versus a Conventional SDD Makes Phase Mapping a Practical Solution for Rare Earth Mineral Characterization. Microsc Microanal24(3): 238–248. doi: 10.1017/S1431927618000417

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