Hostname: page-component-788cddb947-wgjn4 Total loading time: 0 Render date: 2024-10-08T06:11:42.831Z Has data issue: false hasContentIssue false
  • English
  • Français

Shedding New Light on Cathodoluminescence—A Low Voltage Perspective

Published online by Cambridge University Press:  05 December 2012

Natasha Erdman ,
Charles Nielsen  and
Vernon E. Robertson
Natasha Erdman*
Affiliation:
JEOL USA Inc., 11 Dearborn Rd., Peabody, MA 01960, USA
Charles Nielsen
Affiliation:
JEOL USA Inc., 11 Dearborn Rd., Peabody, MA 01960, USA
Vernon E. Robertson
Affiliation:
JEOL USA Inc., 11 Dearborn Rd., Peabody, MA 01960, USA
*
*Corresponding author. E-mail: erdman@jeol.com
Get access

Abstract

Previously, imaging and analysis with cathodoluminescence (CL) detectors required using high accelerating voltages. Utilization of lower accelerating voltage for microanalysis has the advantages of reduced beam-specimen interaction volume, and thus better spatial resolution, as well as reduction in electron beam induced damage. This article will highlight recent developments in field emission gun–scanning electron microscope technology that have allowed acquisition of high spatial resolution CL images at very low accelerating voltages. The advantages of low kV CL imaging will be shown using examples of a geological specimen (shale) and a specimen of an industrial grade diamond.

Keywords

cathodoluminescencelow voltageFEG-SEMpanchromatic
Type
Special Section: Cathodoluminescence
Information
Microscopy and Microanalysis , Volume 18 , Issue 6 , December 2012 , pp. 1246 - 1252
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

Boggs, S. & Krinsley, D. (2006). Application of Cathodoluminescence Imaging to the Study of Sedimentary Rocks. New York: Cambridge University Press.CrossRefGoogle Scholar
Boland, J.N. & Li, X.S. (2010). Microstructural characterisation and wear behaviour of diamond composite materials. Materials 3, 1390–1419.Google Scholar
Brookes, E.J., Greenwood, P. & Xing, G. (1999). The plastic deformation and strain-induced fracture of natural and synthetic diamond. Diam Relat Mater 8, 1536–1539.CrossRefGoogle Scholar
De, S., Heanley, P.J., Fei, Y. & Vicenzi, E. (2004). Microstructural study of synthetic sintered diamond and comparison with carbonado, a natural polycrystalline diamond. Am Mineral 89, 438–445.CrossRefGoogle Scholar
Erdman, N., Campbell, R. & Asahina, S. (2006). Precise SEM cross section polishing via argon beam milling. Microsc Today 14(3), 22–25.Google Scholar
Field, J. (1992). Properties of Natural and Synthetic Diamond. London: Academic Press.Google Scholar
Haggerty, S. (1999). A diamond trilogy: Superplumes, supercontinents, and supernovae. Science 285, 851–860.Google Scholar
Hovington, P., Drouin, D. & Gauvin, R. (1997). CASINO: A new era of Monte Carlo code in C language for the electron beam interaction—Part I: Description of the programme. Scanning 19, 1–14.Google Scholar
Milner, M., McLin, R. & Petriello, J. (2010). Imaging texture and porosity in mudstone and shales: Comparison of secondary and ion-milled backscatter SEM methods. Publication 138975. Canadian Society for Unconventional Gas/Society of Petroleum Engineers. CrossRefGoogle Scholar
Yacobi, B.G. & Holt, D.B. (1990). Cathodoluminescence Microscopy of Inorganic Solids. New York: Plenum Press.Google Scholar